Download Image SXM 192

Publisher's description

Image analysis software NIH Image extended to handle scanning microscope images

Image SXM is a version of the public domain image analysis software NIH Image that has been extended to handle the loading, display and analysis of scanning microscope images. Image SXM supports SAM, SCM, SEM, SFM, SLM, SNOM, SPM and STM images from the following systems: Asylum Research, Burleigh Instruments, Digital Instruments NanoScope II, Digital Instruments NanoScope III/IV, DME Rasterscope, DME Surface Data File, Gatan DigitalMicrograph, JEOL JSM, JEOL WinSem, JEOL WinSPM, JPK Instruments, Klocke Nanotechnik Atomikro, Leica TCS, LEO SEM, Molecular Imaging PicoScan, NanoMagnetics Instruments SPMSIF, Nanonics Imaging, Nanonis, Nanotec Electronica WSxM, Noran Instruments Vantage, NT-MDT, Omicron Vakuumphysik, Omicron SCALA, Oxford Instruments TOPSystem, Park Scientific Instruments HFS-LIF, Park Scientific Instruments HDF, Philips SEM, Quesant Instruments, RHK Technology SPM-32, RHK Technology XPM Pro, Seiko Instruments (SIINT) SPI, SPECS STM Aarhus, ThermoMicroscopes, TopoMetrix SPMLab, Unisoku, Vacuum Generators SAM, WA Technology, Zeiss LSM.

Changes on the new version:
New 'Remove Low Frequencies'. New 'Find Matching Shapes'. New 'Find XY Displacements'. New 'Find Edges (5x5)' filter. Cmd-G will grab a frame from a firewire camera. New 'Bounding Box' added to 'Measurement Options'. Updated support for Molecular Imaging PicoScan v5.3.

Available Translations:None

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